A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans

Li Tian, Sei-ichiro Kamata. A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans. IEICE Transactions, 91-D(10):2477-2484, 2008. [doi]

Authors

Li Tian

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Sei-ichiro Kamata

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