Li Tian, Sei-ichiro Kamata. A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans. IEICE Transactions, 91-D(10):2477-2484, 2008. [doi]
@article{TianK08a,
title = {A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans},
author = {Li Tian and Sei-ichiro Kamata},
year = {2008},
doi = {10.1093/ietisy/e91-d.10.2477},
url = {http://dx.doi.org/10.1093/ietisy/e91-d.10.2477},
tags = {pattern matching},
researchr = {https://researchr.org/publication/TianK08a},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-D},
number = {10},
pages = {2477-2484},
}