Haoye Tian, Yinghua Li, Weiguo Pian, Abdoul Kader Kaboré, Kui Liu 0001, Andrew Habib, Jacques Klein, Tegawendé F. Bissyandé. Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering Methodology, 31(4), 2022. [doi]
@article{TianLPKLHKB22,
title = {Predicting Patch Correctness Based on the Similarity of Failing Test Cases},
author = {Haoye Tian and Yinghua Li and Weiguo Pian and Abdoul Kader Kaboré and Kui Liu 0001 and Andrew Habib and Jacques Klein and Tegawendé F. Bissyandé},
year = {2022},
doi = {10.1145/3511096},
url = {https://doi.org/10.1145/3511096},
researchr = {https://researchr.org/publication/TianLPKLHKB22},
cites = {0},
citedby = {0},
journal = {ACM Transactions on Software Engineering Methodology},
volume = {31},
number = {4},
}