Haoye Tian, Yinghua Li, Weiguo Pian, Abdoul Kader Kaboré, Kui Liu 0001, Andrew Habib, Jacques Klein, Tegawendé F. Bissyandé. Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering Methodology, 31(4), 2022. [doi]
Abstract is missing.