A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images

Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland. A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Technometrics, 59(2):247-261, 2017. [doi]

Authors

Ye Tian

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Ranjan Maitra

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William Q. Meeker

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Stephen D. Holland

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