Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland. A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Technometrics, 59(2):247-261, 2017. [doi]
@article{TianMMH17,
title = {A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images},
author = {Ye Tian and Ranjan Maitra and William Q. Meeker and Stephen D. Holland},
year = {2017},
doi = {10.1080/00401706.2016.1153000},
url = {http://dx.doi.org/10.1080/00401706.2016.1153000},
researchr = {https://researchr.org/publication/TianMMH17},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {59},
number = {2},
pages = {247-261},
}