Successive approximation method for the measurement of thickness using pulsed eddy current

Lulu Tian, Chun Yin, Yuhua Cheng, Libing Bai. Successive approximation method for the measurement of thickness using pulsed eddy current. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 848-852, IEEE, 2015. [doi]

Abstract

Abstract is missing.