Yuchi Tian, Ziyuan Zhong, Vicente Ordonez, Gail E. Kaiser, Baishakhi Ray. Testing DNN image classifiers for confusion & bias errors. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE '20: 42nd International Conference on Software Engineering, Companion Volume, Seoul, South Korea, 27 June - 19 July, 2020. pages 304-305, ACM, 2020. [doi]
@inproceedings{TianZOKR20a, title = {Testing DNN image classifiers for confusion & bias errors}, author = {Yuchi Tian and Ziyuan Zhong and Vicente Ordonez and Gail E. Kaiser and Baishakhi Ray}, year = {2020}, doi = {10.1145/3377812.3390799}, url = {https://doi.org/10.1145/3377812.3390799}, researchr = {https://researchr.org/publication/TianZOKR20a}, cites = {0}, citedby = {0}, pages = {304-305}, booktitle = {ICSE '20: 42nd International Conference on Software Engineering, Companion Volume, Seoul, South Korea, 27 June - 19 July, 2020}, editor = {Gregg Rothermel and Doo-Hwan Bae}, publisher = {ACM}, isbn = {978-1-4503-7122-3}, }