Yuchi Tian, Ziyuan Zhong, Vicente Ordonez, Gail E. Kaiser, Baishakhi Ray. Testing DNN image classifiers for confusion & bias errors. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE '20: 42nd International Conference on Software Engineering, Companion Volume, Seoul, South Korea, 27 June - 19 July, 2020. pages 304-305, ACM, 2020. [doi]
Abstract is missing.