Automatic generation of opaque constants based on the k-clique problem for resilient data obfuscation

Roberto Tiella, Mariano Ceccato. Automatic generation of opaque constants based on the k-clique problem for resilient data obfuscation. In Martin Pinzger, Gabriele Bavota, Andrian Marcus, editors, IEEE 24th International Conference on Software Analysis, Evolution and Reengineering, SANER 2017, Klagenfurt, Austria, February 20-24, 2017. pages 182-192, IEEE Computer Society, 2017. [doi]

Authors

Roberto Tiella

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Mariano Ceccato

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