Roberto Tiella, Mariano Ceccato. Automatic generation of opaque constants based on the k-clique problem for resilient data obfuscation. In Martin Pinzger, Gabriele Bavota, Andrian Marcus, editors, IEEE 24th International Conference on Software Analysis, Evolution and Reengineering, SANER 2017, Klagenfurt, Austria, February 20-24, 2017. pages 182-192, IEEE Computer Society, 2017. [doi]
Abstract is missing.