Chin-Wei Tien, Tse-Yung Huang, Ping Chun Chen, Jenq-Haur Wang. Automatic Device Identification and Anomaly Detection with Machine Learning Techniques in Smart Factories. In Xintao Wu, Chris Jermaine, Li Xiong 0001, Xiaohua Hu 0001, Olivera Kotevska, Siyuan Lu, Weija Xu, Srinivas Aluru, ChengXiang Zhai, Eyhab Al-Masri, Zhiyuan Chen 0003, Jeff Saltz 0001, editors, IEEE International Conference on Big Data, Big Data 2020, Atlanta, GA, USA, December 10-13, 2020. pages 3539-3544, IEEE, 2020. [doi]
Abstract is missing.