Carsten Tietje, Richard Leach, Michele Turitto, Ronaldo Ronaldo, Svetan M. Ratchev. Application of a DFµA Methodology to facilitate the assembly of a Micro/Nano Measurement Device. In Svetan M. Ratchev, Sandra Koelemeijer, editors, Micro-Assembly Technologies and Applications, IFIP TC5 WG5.5 Fourth International Precision Assembly Seminar (IPAS 2008), Chamonix, France, February 10-13, 2008. Volume 260 of IFIP, pages 5-12, Springer, 2008. [doi]
Abstract is missing.