A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin

Daniel Tille, Leon Klimasch, Sebastian Huhn 0001. A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-6, IEEE, 2023. [doi]

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