A Novel Approach to Test Generation for VLSI - researchr publication authors

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C. Timoc, F. Stott, L. Hess. A Novel Approach to Test Generation for VLSI. In COMPCON 82, Digest of Papers, Twenty-Fourth IEEE Computer Society International Conference, San Francisco, California, USA, February 22-25, 1982. pages 78-86, IEEE Computer Society, 1982.

This author has not been identified. Look up 'C. Timoc' in GoogleThis author has not been identified. Look up 'F. Stott' in GoogleThis author has not been identified. Look up 'L. Hess' in Google

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