C. Timoc, F. Stott, L. Hess. A Novel Approach to Test Generation for VLSI. In COMPCON 82, Digest of Papers, Twenty-Fourth IEEE Computer Society International Conference, San Francisco, California, USA, February 22-25, 1982. pages 78-86, IEEE Computer Society, 1982.
@inproceedings{TimocSH82,
title = {A Novel Approach to Test Generation for VLSI},
author = {C. Timoc and F. Stott and L. Hess},
year = {1982},
tags = {testing, C++, systematic-approach},
researchr = {https://researchr.org/publication/TimocSH82},
cites = {0},
citedby = {0},
pages = {78-86},
booktitle = {COMPCON 82, Digest of Papers, Twenty-Fourth IEEE Computer Society International Conference, San Francisco, California, USA, February 22-25, 1982},
publisher = {IEEE Computer Society},
}