Histogram Based Testing Strategy for ADC

Hsin-Wen Ting, Bin-Da Liu, Soon-Jyh Chang. Histogram Based Testing Strategy for ADC. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 51-54, IEEE, 2006. [doi]

Authors

Hsin-Wen Ting

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Bin-Da Liu

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Soon-Jyh Chang

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