Yu-Chieh Ting, Daw-Tung Lin, Chih-Feng Chen, Bor-Chen Tsai. Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network. In Jacques Blanc-Talon, Patrice Delmas, Wilfried Philips, Dan Popescu 0001, Paul Scheunders, editors, Advanced Concepts for Intelligent Vision Systems - 20th International Conference, ACIVS 2020, Auckland, New Zealand, February 10-14, 2020, Proceedings. Volume 12002 of Lecture Notes in Computer Science, pages 360-369, Springer, 2020. [doi]
@inproceedings{TingLCT20,
title = {Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network},
author = {Yu-Chieh Ting and Daw-Tung Lin and Chih-Feng Chen and Bor-Chen Tsai},
year = {2020},
doi = {10.1007/978-3-030-40605-9_31},
url = {https://doi.org/10.1007/978-3-030-40605-9_31},
researchr = {https://researchr.org/publication/TingLCT20},
cites = {0},
citedby = {0},
pages = {360-369},
booktitle = {Advanced Concepts for Intelligent Vision Systems - 20th International Conference, ACIVS 2020, Auckland, New Zealand, February 10-14, 2020, Proceedings},
editor = {Jacques Blanc-Talon and Patrice Delmas and Wilfried Philips and Dan Popescu 0001 and Paul Scheunders},
volume = {12002},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-40605-9},
}