Yu-Chieh Ting, Daw-Tung Lin, Chih-Feng Chen, Bor-Chen Tsai. Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network. In Jacques Blanc-Talon, Patrice Delmas, Wilfried Philips, Dan Popescu 0001, Paul Scheunders, editors, Advanced Concepts for Intelligent Vision Systems - 20th International Conference, ACIVS 2020, Auckland, New Zealand, February 10-14, 2020, Proceedings. Volume 12002 of Lecture Notes in Computer Science, pages 360-369, Springer, 2020. [doi]
Abstract is missing.