Yi-Hsuan Ting, Chih-Yang Wang, Yu-Sian Chang, Tay-Jyi Lin, Shih-Chieh Chang, Jinn-Shyan Wang. Overoptimistic voltage scaling in pre-error AVS systems and learning-based alleviation. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 350-355, IEEE, 2016. [doi]
@inproceedings{TingWCLCW16,
title = {Overoptimistic voltage scaling in pre-error AVS systems and learning-based alleviation},
author = {Yi-Hsuan Ting and Chih-Yang Wang and Yu-Sian Chang and Tay-Jyi Lin and Shih-Chieh Chang and Jinn-Shyan Wang},
year = {2016},
doi = {10.1109/SOCC.2016.7905508},
url = {http://dx.doi.org/10.1109/SOCC.2016.7905508},
researchr = {https://researchr.org/publication/TingWCLCW16},
cites = {0},
citedby = {0},
pages = {350-355},
booktitle = {29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016},
editor = {Karan S. Bhatia and Massimo Alioto and Danella Zhao and Andrew Marshall and Ramalingam Sridhar},
publisher = {IEEE},
isbn = {978-1-5090-1367-8},
}