Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi, Rubin A. Parekhji. A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 53-58, IEEE Computer Society, 2008. [doi]
Abstract is missing.