Mohamed Tlig, Jaleleddine Ben Hadj Slama, M. A. Belaid. Power RF N-LDMOS ageing effect on conducted electromagnetic interferences. In 10th International Multi-Conferences on Systems, Signals & Devices, SSD 2013, Hammamet, Tunisia, March 18-21, 2013. pages 1-5, IEEE, 2013. [doi]
Abstract is missing.