Nguyen Van Toan, Dam Minh Tung, Jeong-Gun Lee. Measurements of metastability in MUTEX on an FPGA. IEICE Electronic Express, 15(1):20171165, 2018. [doi]
@article{ToanTL18,
title = {Measurements of metastability in MUTEX on an FPGA},
author = {Nguyen Van Toan and Dam Minh Tung and Jeong-Gun Lee},
year = {2018},
doi = {10.1587/elex.14.20171165},
url = {https://doi.org/10.1587/elex.14.20171165},
researchr = {https://researchr.org/publication/ToanTL18},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {15},
number = {1},
pages = {20171165},
}