Worst-case power supply noise and temperature distribution analysis for 3D PDNs with multiple clock domains

Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Worst-case power supply noise and temperature distribution analysis for 3D PDNs with multiple clock domains. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]

@inproceedings{Todri-SanialBDG13,
  title = {Worst-case power supply noise and temperature distribution analysis for 3D PDNs with multiple clock domains},
  author = {Aida Todri-Sanial and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel},
  year = {2013},
  doi = {10.1109/NEWCAS.2013.6573628},
  url = {http://dx.doi.org/10.1109/NEWCAS.2013.6573628},
  researchr = {https://researchr.org/publication/Todri-SanialBDG13},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013},
  publisher = {IEEE},
  isbn = {978-1-4799-0618-5},
}