Kar-Ann Toh. Error-Rate Based Biometrics Fusion. In Seong-Whan Lee, Stan Z. Li, editors, Advances in Biometrics, International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings. Volume 4642 of Lecture Notes in Computer Science, pages 191-200, Springer, 2007. [doi]
Abstract is missing.