Nikita Tolkach, Nikolay V. Vishnyakov, Yuri Vorobyov, Aleksei Maslov. Modeling of the drift of atomic-force microscope probe for local chemical nanodiagnostics. In 5th Mediterranean Conference on Embedded Computing, MECO 2016, Bar, Montenegro, June 12-16, 2016. pages 87-89, IEEE, 2016. [doi]
Abstract is missing.