Daniel Tomaszewski, Jolanta Malesinska, Grzegorz Gluszko, Krzysztof Kucharski. Current vs Substrate Bias Characteristics of MOSFETs as a Tool for Parameter Extraction. In Andrzej Napieralksi, editor, 26th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2019, Rzeszów, Poland, June 27-29, 2019. pages 87-91, IEEE, 2019. [doi]
Abstract is missing.