M. F. Toner, Gordon W. Roberts. A BIST Scheme for an SNR Test of a Sigma-Delta ADC. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 805-814, IEEE Computer Society, 1993.
@inproceedings{TonerR93,
title = {A BIST Scheme for an SNR Test of a Sigma-Delta ADC},
author = {M. F. Toner and Gordon W. Roberts},
year = {1993},
tags = {testing},
researchr = {https://researchr.org/publication/TonerR93},
cites = {0},
citedby = {0},
pages = {805-814},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}