Yin Tong, Hao Lan, Jin Guo. Verification of Detectability in Labeled Petri Nets. In 2019 American Control Conference, ACC 2019, Philadelphia, PA, USA, July 10-12, 2019. pages 5627-5632, IEEE, 2019. [doi]
@inproceedings{TongLG19, title = {Verification of Detectability in Labeled Petri Nets}, author = {Yin Tong and Hao Lan and Jin Guo}, year = {2019}, url = {http://ieeexplore.ieee.org/document/8814774}, researchr = {https://researchr.org/publication/TongLG19}, cites = {0}, citedby = {0}, pages = {5627-5632}, booktitle = {2019 American Control Conference, ACC 2019, Philadelphia, PA, USA, July 10-12, 2019}, publisher = {IEEE}, isbn = {978-1-5386-7926-5}, }