Constructing Control Process for Wafer Defects Using Data Mining Technique - researchr publication

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Leeing Tong, Hsingyin Lee, Chifeng Huang, Changke Lin, Chienhui Yang. Constructing Control Process for Wafer Defects Using Data Mining Technique. In Jian Chen, editor, The Fourth International Conference on Electronic Business - Shaping Business Strategy in a Networked World. pages 1125-1129, Academic Publishers/World Publishing Corporation, 2004.

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