Optimal Seed Generation for Delay Fault Detection BIST

Lihong Tong, Kazuki Suzuki, Hideo Ito. Optimal Seed Generation for Delay Fault Detection BIST. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 116-121, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.