An Explainable Deep Learning-based Approach for Multivariate Time Series Anomaly Detection in IoT

Aafan Ahmad Toor, Jia-Chun Lin, Ernst Gunnar Gran, Ming-Chang Lee. An Explainable Deep Learning-based Approach for Multivariate Time Series Anomaly Detection in IoT. In International Conference on Frontiers of Information Technology, FIT 2023, Islamabad, Pakistan, December 11-12, 2023. pages 108-113, IEEE, 2023. [doi]

Authors

Aafan Ahmad Toor

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Jia-Chun Lin

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Ernst Gunnar Gran

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Ming-Chang Lee

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