An Explainable Deep Learning-based Approach for Multivariate Time Series Anomaly Detection in IoT

Aafan Ahmad Toor, Jia-Chun Lin, Ernst Gunnar Gran, Ming-Chang Lee. An Explainable Deep Learning-based Approach for Multivariate Time Series Anomaly Detection in IoT. In International Conference on Frontiers of Information Technology, FIT 2023, Islamabad, Pakistan, December 11-12, 2023. pages 108-113, IEEE, 2023. [doi]

Abstract

Abstract is missing.