Topi Toosi, Miki Sirola, Jarkko Laukkanen, Mark van Heeswijk, Juha Karhunen. Detecting aging of process sensors with noise signal measurement. In 9th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, IDAACS 2017, Bucharest, Romania, September 21-23, 2017. pages 35-40, IEEE, 2017. [doi]
Abstract is missing.