Rasit Onur Topaloglu. Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 136-142, IEEE Computer Society, 2006. [doi]
Abstract is missing.