Rasit Onur Topaloglu. Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 498-501, IEEE Computer Society, 2008. [doi]
@inproceedings{Topaloglu08,
title = {Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics},
author = {Rasit Onur Topaloglu},
year = {2008},
doi = {10.1109/ISQED.2008.165},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.165},
tags = {modeling, process modeling},
researchr = {https://researchr.org/publication/Topaloglu08},
cites = {0},
citedby = {0},
pages = {498-501},
booktitle = {9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3117-5},
}