Rasit Onur Topaloglu. Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 498-501, IEEE Computer Society, 2008. [doi]
No references recorded for this publication.
No citations of this publication recorded.