Naoya Torii, Dai Yamamoto, Tsutomu Matsumoto. Evaluation of Latch-based Physical Random Number Generator Implementation on 40 nm ASICs. In Edgar E. Weippl, Stefan Katzenbeisser 0001, Mathias Payer, Stefan Mangard, Xinxin Fan, Tim Güneysu, editors, Proceedings of the 6th International Workshop on Trustworthy Embedded Devices, TrustED@CCS 16, Vienna, Austria, October 28, 2016. pages 23-30, ACM, 2016. [doi]
Abstract is missing.