Yuma Torikoshi, Yasuharu Nishi, Juichi Takahashi. Sensitive Region-Based Metamorphic Testing Framework using Explainable AI. In 8th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2023, Melbourne, Australia, May 14, 2023. pages 25-30, IEEE, 2023. [doi]
@inproceedings{TorikoshiNT23,
title = {Sensitive Region-Based Metamorphic Testing Framework using Explainable AI},
author = {Yuma Torikoshi and Yasuharu Nishi and Juichi Takahashi},
year = {2023},
doi = {10.1109/MET59151.2023.00011},
url = {https://doi.org/10.1109/MET59151.2023.00011},
researchr = {https://researchr.org/publication/TorikoshiNT23},
cites = {0},
citedby = {0},
pages = {25-30},
booktitle = {8th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2023, Melbourne, Australia, May 14, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0176-2},
}