Yuma Torikoshi, Yasuharu Nishi, Juichi Takahashi. Sensitive Region-Based Metamorphic Testing Framework using Explainable AI. In 8th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2023, Melbourne, Australia, May 14, 2023. pages 25-30, IEEE, 2023. [doi]
Abstract is missing.