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Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology

Giulio Torrente, Jean Coignus, Alexandre Vernhet, Jean-Luc Ogier, David Roy 0001, Gérard Ghibaudo. Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. Microelectronics Reliability, 79:281-287, 2017. [doi]

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Giulio Torrente

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Jean Coignus

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Alexandre Vernhet

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Jean-Luc Ogier

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David Roy 0001

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Gérard Ghibaudo

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