Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology

Giulio Torrente, Jean Coignus, Alexandre Vernhet, Jean-Luc Ogier, David Roy 0001, GĂ©rard Ghibaudo. Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology. Microelectronics Reliability, 79:281-287, 2017. [doi]

Abstract

Abstract is missing.