Frank Sill Torres, Alberto García Ortiz, Rolf Drechsler. HotAging - Impact of Power Dissipation on Hardware Degradation. In IEEE International Symposium on Circuits and Systems, ISCAS 2019, Sapporo, Japan, May 26-29, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{TorresOD19,
title = {HotAging - Impact of Power Dissipation on Hardware Degradation},
author = {Frank Sill Torres and Alberto García Ortiz and Rolf Drechsler},
year = {2019},
doi = {10.1109/ISCAS.2019.8702073},
url = {https://doi.org/10.1109/ISCAS.2019.8702073},
researchr = {https://researchr.org/publication/TorresOD19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2019, Sapporo, Japan, May 26-29, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0397-6},
}