Gustavo M. Torres, Adriana S. Souza, David A. O. Ferreira, Luiz C. S. G. Júnior, Kethilen Y. Ouchi, Myke D. M. Valadão, Mateus O. Silva, Victor L. G. Cavalcante, Edma V. C. U. Mattos, Antônio M. C. Pereira, Caio F. S. Cruz, Agemilson P. Silva, Ruan J. S. Belem, André S. Costa, Lucas G. C. Evangelista, Wilson C. C. Junior, Ricardo G. Paula, Thiago B. Bezerra, Waldir S. S. Junior, Celso B. Carvalho. Automated Mura Defect Detection System on LCD Displays using Random Forest Classifier. In IEEE International Conference on Consumer Electronics, ICCE 2021, Las Vegas, NV, USA, January 10-12, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{TorresSFJOVSCMP21,
title = {Automated Mura Defect Detection System on LCD Displays using Random Forest Classifier},
author = {Gustavo M. Torres and Adriana S. Souza and David A. O. Ferreira and Luiz C. S. G. Júnior and Kethilen Y. Ouchi and Myke D. M. Valadão and Mateus O. Silva and Victor L. G. Cavalcante and Edma V. C. U. Mattos and Antônio M. C. Pereira and Caio F. S. Cruz and Agemilson P. Silva and Ruan J. S. Belem and André S. Costa and Lucas G. C. Evangelista and Wilson C. C. Junior and Ricardo G. Paula and Thiago B. Bezerra and Waldir S. S. Junior and Celso B. Carvalho},
year = {2021},
doi = {10.1109/ICCE50685.2021.9427579},
url = {https://doi.org/10.1109/ICCE50685.2021.9427579},
researchr = {https://researchr.org/publication/TorresSFJOVSCMP21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2021, Las Vegas, NV, USA, January 10-12, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9766-1},
}