Gustavo M. Torres, Adriana S. Souza, David A. O. Ferreira, Luiz C. S. G. Júnior, Kethilen Y. Ouchi, Myke D. M. Valadão, Mateus O. Silva, Victor L. G. Cavalcante, Edma V. C. U. Mattos, Antônio M. C. Pereira, Caio F. S. Cruz, Agemilson P. Silva, Ruan J. S. Belem, André S. Costa, Lucas G. C. Evangelista, Wilson C. C. Junior, Ricardo G. Paula, Thiago B. Bezerra, Waldir S. S. Junior, Celso B. Carvalho. Automated Mura Defect Detection System on LCD Displays using Random Forest Classifier. In IEEE International Conference on Consumer Electronics, ICCE 2021, Las Vegas, NV, USA, January 10-12, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.