Sampling Relevant Points for Surface Registration

Andrea Torsello, Emanuele RodolĂ , Andrea Albarelli. Sampling Relevant Points for Surface Registration. In Michael Goesele, Yasuyuki Matsushita, Ryusuke Sagawa, Ruigang Yang, editors, International Conference on 3D Imaging, Modeling, Processing, Visualization and Transmission, 3DIMPVT 2011, Hangzhou, China, 16-19 May 2011. pages 290-295, IEEE, 2011. [doi]

Abstract

Abstract is missing.