Test point insertion based on path tracing

Nur A. Touba, Edward J. McCluskey. Test point insertion based on path tracing. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 2-8, IEEE Computer Society, 1996. [doi]

Authors

Nur A. Touba

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Edward J. McCluskey

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