Testing Embedded Cores Using Partial Isolation Rings

Nur A. Touba, Bahram Pouya. Testing Embedded Cores Using Partial Isolation Rings. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 10-16, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.