André Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné. On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. Microelectronics Reliability, 52(1):124-129, 2012. [doi]
@article{TouboulFWS12,
title = {On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum},
author = {André Touboul and L. Foro and Frederic Wrobel and Frédéric Saigné},
year = {2012},
doi = {10.1016/j.microrel.2011.08.023},
url = {http://dx.doi.org/10.1016/j.microrel.2011.08.023},
researchr = {https://researchr.org/publication/TouboulFWS12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {1},
pages = {124-129},
}