Machine Learning Systems in the IoT: Trustworthiness Trade-offs for Edge Intelligence - researchr publication authors

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Wiebke Toussaint, Aaron Yi Ding. Machine Learning Systems in the IoT: Trustworthiness Trade-offs for Edge Intelligence. In 2nd IEEE International Conference on Cognitive Machine Intelligence, CogMI 2020, Atlanta, GA, USA, October 28-31, 2020. pages 177-184, IEEE, 2020. [doi]

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